Concomitants of Upper Record Statistics for Bivariate Pseudo–Weibull Distribution

Authors

Muhammad Ahsanullah, Rider University
Saman Shahbaz, COMSATS Institute of Information Technology
Muhammad Qaiser Shahbaz, COMSATS Institute of Information Technology
Muhammad Mohsin, COMSATS Institute of Information Technology

Abstract

In this paper the Bivariate Pseudo–Weibull distribution has been defined as a compound distribution of two random variables to model the failure rate of component reliability. The distribution of r–th concomitant and joint distribution of r–th and s–th concomitant of record statistics of the resulting distribution have been derived. Single and product moments alongside the correlation coefficient have also been obtained. Recurrence relation for the single moments has also been obtained for the resulting distributions.

Recommended Citation

Ahsanullah, Muhammad; Shahbaz, Saman; Shahbaz, Muhammad Qaiser; and Mohsin, Muhammad (2010). Concomitants of Upper Record Statistics for Bivariate Pseudo–Weibull Distribution, Applications and Applied Mathematics: An International Journal (AAM), Vol. 5, Iss. 2, Article 3.
Available at: https://digitalcommons.pvamu.edu/aam/vol5/iss2/3